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authordbrownell <dbrownell@b42882b7-edfa-0310-969c-e2dbd0fdcd60>2009-09-26 19:08:34 +0000
committerdbrownell <dbrownell@b42882b7-edfa-0310-969c-e2dbd0fdcd60>2009-09-26 19:08:34 +0000
commit2e210ee48fa5a2dfc1ddc3b47c1aef4da814ca25 (patch)
tree75919eddc5172f5519d806fa5d5c6b440471bc5e /testing/build.test1/Makefile.openocd
parentad43374c7fe781ede0f5472f9cbdc55fc9486a6d (diff)
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Streamline Capture-IR handling and integrity test.
Change the handling of the "-ircapture" and "-irmask" parameters to be slightly more sensible, given that the JTAG spec describes what is required, and that we already require that conformance in one place. IR scan returns some bitstring with LSBs "01". - First, provide and use default values that satisfy the IEEE spec. Existing TAP configs will override the defaults, but those parms are no longer required. - Second, warn if any TAP gets set up to violate the JTAG spec. It's likely a bug, but maybe not; else this should be an error. Improve the related diagnostics to say which TAP is affected. And associated minor fixes/cleanups to comments and diagnostics. git-svn-id: svn://svn.berlios.de/openocd/trunk@2758 b42882b7-edfa-0310-969c-e2dbd0fdcd60
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