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author | dbrownell <dbrownell@b42882b7-edfa-0310-969c-e2dbd0fdcd60> | 2009-09-22 05:39:06 +0000 |
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committer | dbrownell <dbrownell@b42882b7-edfa-0310-969c-e2dbd0fdcd60> | 2009-09-22 05:39:06 +0000 |
commit | 50b94628aec9b94e2aa6d326c48c896c718d7e46 (patch) | |
tree | 7666f34f6e61d330f69fa69c4a85e44f2b6d30a3 /testing/examples/SAM7X256Test | |
parent | 6cba4863563c2dabe9abc2b23e02f6ace1941d03 (diff) | |
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Make it easier to erase or protect through to the end
of a (NOR) flash chip: allow passing "last" as an alias
for the number of the last sector.
Improve several aspects of error checking while we're at it.
From: Johnny Halfmoon <jhalfmoon@milksnot.com>
git-svn-id: svn://svn.berlios.de/openocd/trunk@2746 b42882b7-edfa-0310-969c-e2dbd0fdcd60
Diffstat (limited to 'testing/examples/SAM7X256Test')
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